타이틀 |
Interim Test Status Report for NEPP Scaled CMOS |
저자 |
Bowles-Martinez, Jessica N.;; Guertin, Steven M. |
Keyword |
CMOS;; DATA ACQUISITION;; ELECTRIC EQUIPMENT TESTS;; ELECTRICAL MEASUREMENT;; ELECTRONIC EQUIPMENT TESTS;; RELIABILITY;; STABILITY TESTS |
URL |
http://hdl.handle.net/2060/20110008028 |
보고서번호 |
JPL-Publ-10-13 |
발행년도 |
2010 |
출처 |
NTRS (NASA Technical Report Server) |
ABSTRACT |
This document serves as the fiscal year end report for the NEPP scaled complementary metal-oxide semiconductor (CMOS) task. Much of the effort this year focused on development of test capability and initial collection of data on SDRAM devices. Since the system has only just begun (in the last four weeks) to gather data, this report focuses on the test system and preliminary results. |