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    기술보고서 게시판 내용
    타이틀 Proton Upset Monte Carlo Simulation
    저자 O''Neill, Patrick M.;; Kouba, Coy K.;; Foster, Charles C.
    Keyword MICROELECTRONICS;; MONTE CARLO METHOD;; PROTONS;; RADIATION DAMAGE;; SATELLITE-BORNE INSTRUMENTS;; COMPUTERIZED SIMULATION;; SINGLE EVENT UPSETS;; SPACECRAFT ELECTRONIC EQUIPMENT;;
    URL http://hdl.handle.net/2060/20090032083
    보고서번호 MSC-24274-1
    발행년도 2009
    출처 NTRS (NASA Technical Report Server)
    ABSTRACT The Proton Upset Monte Carlo Simulation (PROPSET) program calculates the frequency of on-orbit upsets in computer chips (for given orbits such as Low Earth Orbit, Lunar Orbit, and the like) from proton bombardment based on the results of heavy ion testing alone. The software simulates the bombardment of modern microelectronic components (computer chips) with high-energy (.200 MeV) protons. The nuclear interaction of the proton with the silicon of the chip is modeled and nuclear fragments from this interaction are tracked using Monte Carlo techniques to produce statistically accurate predictions.

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